Rabenberg, Lew: search on Z-Library

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1

Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction , Rolf ErniImperial College Press, London, 2010. $88.00 (354 pp.). ISBN 978-1-84816-536-6

Journal:

Year:

2011

Language:

english

File:

PDF, 225 KB

english, 2011

2

Effect of growth base pressure on the thermoelectric properties of indium antimonide nanowires

Zhou, Feng, Moore, Arden L, Pettes, Michael T, Lee, Yong, Seol, Jae Hun, Ye, Qi Laura, Rabenberg, Lew, Shi, Li

Journal:

Journal of Physics D Applied Physics

Year:

2010

Language:

english

File:

PDF, 1.12 MB

english, 2010

3

Damage Caused by Transverse Scattering of Gallium during FIB Milling

Ko, Kil-Soo, Jung, Won-Chae, Chung, Jayhoon, Rabenberg, Lew

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 237 KB

english, 2004

4

Thermal conductivity of indium arsenide nanowires with wurtzite and zinc blende phases

Zhou, Feng, Moore, Arden L., Bolinsson, Jessica, Persson, Ann, Fröberg, Linus, Pettes, Michael T., Kong, Huijun, Rabenberg, Lew, Caroff, Philippe, Stewart, Derek A., Mingo, Natalio, Dick, Kimberly A.,

Journal:

Physical Review B

Year:

2011

Language:

english

File:

PDF, 837 KB

english, 2011

5

Controlled formation and resistivity scaling of nickel silicide nanolines

Li, Bin, Luo, Zhiquan, Shi, Li, Zhou, JiPing, Rabenberg, Lew, Ho, Paul S, Allen, Richard A, Cresswell, Michael W

Journal:

Year:

2009

Language:

english

File:

PDF, 1.21 MB

english, 2009

6

Aqueous Chemical Route to Ferromagnetic 3-D Arrays of Iron Nanorods

Vayssieres, Lionel, Rabenberg, Lew, Manthiram, Arumugam

Journal:

Year:

2002

Language:

english

File:

PDF, 284 KB

english, 2002

7

Practical and Reproducible Mapping of Strains in Si Devices Using Geometric Phase Analysis of Annular Dark-Field Images From Scanning Transmission Electron Microscopy

Jayhoon Chung,, Lian, Guoda, Rabenberg, Lew

Journal:

IEEE Electron Device Letters

Year:

2010

Language:

english

File:

PDF, 437 KB

english, 2010

8

Two-dimensional imaging of the potential distribution within a core/shell nanowire by electron holography

Chung, Jayhoon, Rabenberg, Lew

Journal:

Journal of Materials Research

Year:

2006

Language:

english

File:

PDF, 344 KB

english, 2006

9

Formation and effect of orientation domains in layered oxide cathodes of lithium-ion batteries

Jarvis, Karalee A., Wang, Chih-Chieh, Knight, James C., Rabenberg, Lew, Manthiram, Arumugam, Ferreira, Paulo J.

Journal:

Acta Materialia

Year:

2016

File:

PDF, 2.45 MB

2016

10

Effects of strain gradients on strain measurements using geometrical phase analysis in the transmission electron microscope

Jayhoon Chung, Lew Rabenberg

Journal:

Ultramicroscopy

Year:

2008

Language:

english

File:

PDF, 998 KB

english, 2008

11

Local strain measurement in a strain-engineered complementary metal-oxide-semiconductor device by geometrical phase analysis in the transmission electron microscope

Chung, Jayhoon, Lian, Guoda, Rabenberg, Lew

Journal:

Applied Physics Letters

Year:

2008

Language:

english

File:

PDF, 442 KB

english, 2008

12

TEM Imaging of Amorphous Silicon Oxide - Silicon Nitride - Silicon Oxide Dielectric Films

Rabenberg, Lew, Zhou, J. P., Ko, Kil-Soo, Johnson, Rita

Journal:

Microscopy and Microanalysis

Year:

2001

File:

PDF, 1.27 MB

2001

13

Formation and effect of orientation domains in layered oxide cathodes of lithium-ion batteries

Jarvis, Karalee A., Wang, Chih-Chieh, Knight, James C., Rabenberg, Lew, Manthiram, Arumugam, Ferreira, Paulo J.

Journal:

Acta Materialia

Year:

2016

Language:

english

File:

PDF, 2.45 MB

english, 2016

14

Mapping of electrostatic potentials within core-shell nanowires by electron holography

Chung, Jayhoon, Rabenberg, Lew

Journal:

Applied Physics Letters

Year:

2006

Language:

english

File:

PDF, 466 KB

english, 2006

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